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Home / Products / Burn-in And Tester

Burn-in And Tester

Burn-in And TesterOptical AlignmentSemiconductor PackagingChip TesterHigh precision linear and goniometer slide

Burn-in And Tester

Burn-in And Tester

EML/DML COC Burn-in Equipment

??10 burn-in power units, support up to max 5120 COC
??4 burn-in cassettes supported by each power unit, each burn-in cassette can be independently controlled
??Burn-in cassette can be loaded offline
??Burn-in temperature 50~150℃ adjustable

EML/DML COC Tester

??Automatic magazine loading, 20-COC fish bone fixtures, accomoding a total of 640 COC
??The 32-COC fixture is suitable for both burn-in machine and wire bonder
??Dual platform design, save load/unload and pre-heat time
??TEC temperature control(20~100℃) to meet the temperature accuracy and stability
??LlV and spectrum test
??Support the backlight optical power test

High Power COS Burn-in Equipment

??20 burn-in power units, support up to 640 COS (might be affected by COS power rating)
??2 burn-in cassettes supported by each power unit, burn-in cassette can be loaded offline
??Support in-sute optical power monitoring
??Support pump and industrial laser COS

High Power COS Tester

??Fully enclosed design, the test ambient temperature -10~100℃ adjustable
??Support LIV, PER, optical spectrum, and far-field test
??Support pump and industrial laser COS
??Test fixture shared with burn-in machine

Industrial Laser COS Burn-in Equipment

??High capacity, support up to 384 channels
??Support for CW and QCW mode operation
??The faulty product can be powered off individually
??In-sute optical power, temperature and voltage monitoring for individual channels
??Optical port reserved for wavelength measurement for chip junction temperature calibration
??Alarm and warning mechanism to ensure the safety operation

Auto Industrial Laser COS Tester

??Test LlV, optical spectrum, far field, polarization extinction ratio
??Automatic OCR chip/substrate lD for data binding
??Load/unload flexibly configured with waffle pack, Gel-pack and B/l fixture
??Dual test platforms for parallel test to increase UPH significantly
??Development is in progress to integrate AOl feature for defect detection

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Reception Service Number:0755-23019639

Consultation Email:hongbin.ding@laserx.net & laserx.xs@laserx.net